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• The V2.0 equipment and capabilities of the Innovation Lab are updated and upgraded;
• Contribute to industrial upgrading, focusing on openness, advancement, and win-win cooperation in localization;
• Diversified online and offline interactions, directly hitting the pain points of the test.
Tektronix Advanced Semiconductor Open Lab, a leader in advanced semiconductor testing in Beijing, today announced the launch of Version 2.0 after a comprehensive upgrade of its laboratory. At the same time, we were fortunate to invite Dr. Gao Wei, Deputy Secretary-General of the Third Generation Semiconductor Industry Technology Innovation Strategic Alliance, Hou Xifeng, Deputy Secretary-General of Zhongguancun Trina Wide Bandgap Semiconductor Technology Innovation Alliance, and Guo Daming, Head of the Power Test Platform of the National New Energy Vehicle Innovation Center, as special speakers, and Zhang Xin, Technical Director of Tektronix Technology, also made a wonderful sharing on the spot. Tektronix's partners such as Flyde, Zhongliwei and Ofite also demonstrated the achievements made in the application of third-generation semiconductors in cooperation with Tektronix at the meeting.
This upgrade is not only a leap forward in technical solutions, but also a profound embodiment of the spirit of innovation, aiming to expand comprehensive testing capabilities, provide one-stop solutions, create an open, collaborative and win-win ecological platform, and work with users to meet the challenges of new technology testing.
The third generation of semiconductors is not a new topic, and its vigorous development has taken shape, and the corresponding test needs are increasing day by day. As a leader in the field of test and measurement, Tektronix has been committed to enhancing the core competitiveness of the enterprise and innovating and developing test solutions for the third generation of semiconductors. Since the establishment of the Advanced Semiconductor Open Laboratory in China in 2022, Tektronix has provided free services for more than 300 people and more than 1,000 types of test devices. At the same time, it is also a platform for customer measurement and communication.
In order to better connect with customer testing needs and respond to new technology application scenarios, the laboratory has been upgraded again, and Tektronix Innovation Lab V2.0 has been born, with updated equipment and upgraded capabilities. The upgrade includes GaN device switching testing and dynamic on-resistance testing, short-circuit testing and avalanche testing of SiC power devices, and a more comprehensive static and capacitance parameter test system. In addition, a new reliability test system for third-generation semiconductor power devices has been introduced to meet the growing testing needs.
Tektronix Innovation Lab is committed to building a complete ecological platform to promote exchanges and cooperation inside and outside the industry through diversified online and offline interactions. The reopening of the laboratory not only marks a new milestone in the field of testing technology, but also indicates the further deepening and strengthening of Tektronix's localization process. Tektronix will work more closely with partners to develop more localized solutions with Tektronix test solutions as the core to solve the actual pain points of Chinese customers.
With more comprehensive testing capabilities, we will work with customers to polish products, verify standards, provide high-quality and good services for domestic third-generation semiconductor enterprises, and jointly promote the further development of third-generation semiconductor technology.
DPT1000A dynamic parametric test system
The DPT1000A dynamic parameter test system for power devices was first launched in 2021 to solve common problems in the dynamic characterization of power devices. Tektronix combined its rich experience in the field of time-domain waveform measurement, and together with domestic system integrators, jointly defined and developed this dynamic parameter test system for a new generation of power devices. This system has the characteristics of high test bandwidth, low parasitic parameters, strong compatibility, flexible and convenient system upgrade, and has been widely recognized by the majority of test engineers after the system is launched. In addition to the conventional switching parameters and reverse recovery tests, DPT1000A can also complete avalanche tests, short circuit tests, covering Si MOSFET, IGBT, PMOS, SiC, GaN, etc., the system has a high degree of flexibility and adapts to a variety of test standards.
SPT1000A Static parametric test system
SPT1000A static parameter test system can be used for static parameter testing of various types of discrete devices such as diodes, transistors, insulated gate FETs, junction MOSFETs, unidirectional and bidirectional thyristors, ordinary and high-speed optocouplers, rectifier bridges, common cathode and common anodes, etc.
The system is equipped with an industry-leading source unit (SMU) and a precision LCR meter. This enables the system to achieve accurate measurement and parameter analysis under the conditions of 3kV and 1000/2000A, with leakage current test resolution up to fA level, voltage test resolution up to nV level, and precise measurement of parasitic capacitance at 3000V high voltage. This system is not only suitable for traditional silicon-based power devices, but also can be used for static parameter testing of new power semiconductor devices such as silicon carbide, gallium nitride, gallium oxide, etc.
SPT1000A adopts a one-stop design in the design of the test fixture, after the test piece is inserted into the fixture, it can complete the high-voltage, high-current, and parasitic capacitance related tests at one time, without replacing the test fixture and test connection, simplifying the operation steps and improving the test efficiency. The system supports heating test, and the external optional heat flow meter can be used for high temperature and low temperature.
HTXB-1000B dynamic and static comprehensive aging test system
DHTXB-1000A dynamic and static comprehensive aging test system for the third generation of semiconductor power devices, referring to the AQG-324 standard, according to the unique device characteristics and failure mechanism, under accelerated aging conditions, targeted application of specific pressure conditions (including static pressure and dynamic pressure) to test the leakage current index of the device, and other characteristic parameters (such as threshold voltage, on-resistance and other key indicators), in order to characterize the aging characteristics and working life of the device. It allows device manufacturers and device users to understand the aging characteristics of power devices in a short period of time, as well as the performance changes under long-term use conditions, and predict and analyze possible faults in the actual application process of the device.
DHTOL-1000B power device aging test platform
Due to the relatively short market history of the third-generation semiconductor power devices represented by SiC and GaN, the reliability and lifetime analysis of devices are still at the forefront of scientific research. In this context, there is no unified standard for aging test methods. However, with the active promotion of industry leaders and standardization organizations, such as the JEP180, the High Temperature Operating Life (HTOL) test method for power devices is emerging as an emerging means of evaluating the aging characteristics of these new power devices.
The main advantage of the HTOL test method is its ability to simulate the aging process of the device in a real-world operating environment. By accelerating the degradation process of the device at high temperatures, the method is able to obtain valuable data on the aging characteristics of the device in a relatively short period of time. These data are not only highly convincing to users, but also have important guiding significance for the formulation of product warranty period and maintenance plan.
In addition, by performing hard-switching tests in power supply circuits of specific topologies, the HTOL method can effectively predict the life expectancy of a device under specific operating conditions. This not only provides a scientific basis for product reliability evaluation, but also helps designers gain a deeper understanding of the device's performance over its expected life cycle, so that they can make more accurate decisions during product development and optimization.
About Tektronix Technologies:
Headquartered in Beaverton, Oregon, Tektronix provides innovative, accurate, and easy-to-use test, measurement, and monitoring solutions that solve problems, unlock insights, and drive innovation. For more than 70 years, Tektronix has been at the forefront of the digital age. Join us on our innovation journey at tek.com.cn